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Advances In Imaging And Electron Physics
Optics Of Charged Particle Analyzers
language: english
Publisher:
ELSEVIER SCIENCE PUBLISHING CO INC, September of 2010 ‧
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SYNOPSIS
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780123813145 |
| Publisher: | ELSEVIER SCIENCE PUBLISHING CO INC |
| Release Date: | September of 2010 |
| Language: | English |
| Cover: | Hardcover |
| Pages: | 248 |
| Format: | Book |
| Collection: | Civil War America |
| Categories: |
Books in English
>
Engineering
>
General Engineering
|
| EAN: | 9780123813145 |
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