Advances In Imaging And Electron Physics

Optics Of Charged Particle Analyzers

by Peter W. Hawkes
language: english
Publisher: ELSEVIER SCIENCE PUBLISHING CO INC, September of 2010 ‧
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Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.

Advances In Imaging And Electron Physics

Optics Of Charged Particle Analyzers

by Peter W. Hawkes

Property Description
ISBN: 9780123813145
Publisher: ELSEVIER SCIENCE PUBLISHING CO INC
Release Date: September of 2010
Language: English
Cover: Hardcover
Pages: 248
Format: Book
Collection: Civil War America
Categories: Books in English > Engineering > General Engineering
EAN: 9780123813145

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