Advances In Imaging And Electron Physics

Optics Of Charged Particle Analyzers

by Peter W. Hawkes
language: english
Publisher: ELSEVIER SCIENCE PUBLISHING CO INC, May of 2010 ‧
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Includes articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in different domains.

Advances In Imaging And Electron Physics

Optics Of Charged Particle Analyzers

by Peter W. Hawkes

Property Description
ISBN: 9780123813183
Publisher: ELSEVIER SCIENCE PUBLISHING CO INC
Release Date: May of 2010
Language: English
Dimensions: 152 x 229 x 20 mm
Cover: Hardcover
Pages: 304
Format: Book
Collection: Advances In Agronomy
Categories: Books in English > Science > Physical
EAN: 9780123813183

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