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X-Ray And Neutron Reflectivity: Principles And Applications eBook

by Jean Daillant e Alain Gibaud
language: english
Publisher: Springer Berlin Heidelberg, July of 2003 ‧
59,61€
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The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.

X-Ray And Neutron Reflectivity: Principles And Applications

by Jean Daillant e Alain Gibaud

Property Description
ISBN: 9783540486961
Publisher: Springer Berlin Heidelberg
Release Date: July of 2003
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Lecture Notes In Physics Monographs
Categories: eBooks in English > Science > Physical
EAN: 9783540486961