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Testing Static Random Access Memories eBook
Defects, Fault Models And Test Patterns
language: english
Publisher:
SPRINGER US, June of 2013 ‧
see product details
118,59€
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
IMMEDIATE AVAILABILITY
Ebook for ADE
SYNOPSIS
Covers testing of one of the important semiconductor memories types. This book addresses testing of static random access memories (SRAMs), both single-port and multi-port. It introduces description of realistic fault models, based on defect injection and SPICE simulation.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9781475767063 |
| Publisher: | SPRINGER US |
| Release Date: | June of 2013 |
| Language: | English |
| Format: | eBook |
| File Format and Compatibility: | PDF para ADE |
| Collection: | Frontiers In Electronic Testing |
| Categories: |
eBooks in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9781475767063 |
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