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Testing Static Random Access Memories eBook
Defects, Fault Models And Test Patterns
language: english
Publisher:
SPRINGER US, June of 2013 ‧
see product details
118,59€
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Ebook for ADE
SYNOPSIS
Covers testing of one of the important semiconductor memories types. This book addresses testing of static random access memories (SRAMs), both single-port and multi-port. It introduces description of realistic fault models, based on defect injection and SPICE simulation.
DETeBook com proteção para wookreaderILS
| Property | Description |
|---|---|
| ISBN: | 9781475767063 |
| Publisher: | SPRINGER US |
| Release Date: | June of 2013 |
| Language: | English |
| Format: | eBook |
| Collection: | Frontiers In Electronic Testing |
| Categories: |
eBooks in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9781475767063 |
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