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Testing Static Random Access Memories eBook
Defects, Fault Models And Test Patterns
language: english
Publisher:
SPRINGER US, June of 2013 ‧
see product details
118,59€
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T0RneFZHWk5iVXhaWlhFclNFRmtUVEJPUVRWek9FcGtWWGx2VjNaSE1WQlJObTFTWlZneFZGcDFRa3BaVlZkSmF5OVdTbmhyVTBGaksySmtjR3hQZFVGS2MwNUZTVE5EVFZOYWNreHlUMWxhZDFoaFNqQkVkMXBtWnpCRE4waE5jVU1yZW10cFowaHdZVU5ZTldaSVkyODJWRW93THpVcmVEUTNlVzlRSzNkT2VsTnZLelpaTml0dFZWcEJlbFpyUlZoM1VUQkZPWFZWZGxOSVJXMTFSa1l4Y3k5RE0yUTRaMHRGYW1sMFRHRnBZa1pOTkVGeWJsZDVTMGN2VFhSQkt5OVpNMGh0T0ZGWU0zcFVSbVJNTW1KSWFHSkZXRE14VGtkbk9USllOVEJTUkRZeFZ6SnVha3QyVW0wNVpFbFNaM1pXWVhsQ1RtaEhkR3hhTmpkUE1IRjBhbWhwTDNWVllqSmpNemR6TVhabmIxVmFSeTlLYkZGeldWcGpOVnBvVEZWSmJXMDRaVUphYlhwNWRYWlNRa1JXVTJkNVN6QjBOak0zY0hWblJqQlJSVzlMSzB0WU0xQjJhVEkzVVU5R1NtVlVWbkpCUlRSTFNEbEpSVlZvTWtKbFVHdFdUR3hTYjJNeE5URnNZVWxEYUhsbFdFcHNXa3c0WlNzMGVVSlJUVkpZVm1obVQwTkZRbmRsSzNOMFlYSldObmhTU0hsaU1YTlVUVll4TWtGTFZtUkZhVTQwSzJoV1NsZFZTRWg2T0U1TlRFSklUbmRCU0ZCMlEwOXNSV2wwVTJaNFpEUnpRVlpVUzJkbmJsRldhemR3ZURZM2MxZHVZMjFyUTJSQlYybDNhU3N4ZVU1b2RtcHNWa0Y1TW5WT2FYWXhPSFl3Tmxad0wyWTFlVkk0VVc5bUt6TnlNa2hrZEUwdlEzaGxkRFpCUld4VE0wODNNakkwWjFWcmFXZFdNWGh1ZUdwR1NFWlJRbTlVVDNkMk4xbFVlVGRLZVdwUWEyUk1TbkIwZUZGbWJIQmhXbGxWVEZCaFkwaDVWalV5VTBJemJHcEJOVWRXWWlzdmExZzNLMVJuWkd4eWF6UTNRamMxUVM5eFZuQXpXR2xvYlZkcVVHTnNhRGxDUW14bmMwcElTREZsV1ZWNk4yVllTWGN6VjFVd1pXMW1LMUZMVUdKbGRGQktZV2x3WVhoT2RuTmFXbVZWTjNSdFJUWXdWeXREWTAxQlRGaG5iMlp6YlhscVoxUXJkRmd6YnpOQ2NtcFJTV2Q2WW1rd2VWZGtaME0wVUhKREt6UmFSak5wY0ZBMUwxZGlZbE0wUFE9PTpEU3B3eG5LSkRjd0JRcEF4azd4ZFV3PT0=
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Ebook for ADE
SYNOPSIS
Covers testing of one of the important semiconductor memories types. This book addresses testing of static random access memories (SRAMs), both single-port and multi-port. It introduces description of realistic fault models, based on defect injection and SPICE simulation.
DETeBook com proteção para wookreaderILS
| Property | Description |
|---|---|
| ISBN: | 9781475767063 |
| Publisher: | SPRINGER US |
| Release Date: | June of 2013 |
| Language: | English |
| Format: | eBook |
| Collection: | Frontiers In Electronic Testing |
| Categories: |
eBooks in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9781475767063 |
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