Capa do artigo Synthetic Polymeric Membranes
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Synthetic Polymeric Membranes eBook

Characterization By Atomic Force Microscopy

by Takeshi Matsuura, C. Y. Feng e K. C. Khulbe
language: english
Publisher: Springer Berlin Heidelberg, December of 2007 ‧
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Atomic Force Microscope (AFM) is becoming a very important tool for the characterization of synthetic polymeric membranes. This book focuses on the method developed to study the surfaces of synthetic polymeric membranes using an AFM. It is suitable for academic researchers who are investigating synthetic membranes.

Synthetic Polymeric Membranes

Characterization By Atomic Force Microscopy

by Takeshi Matsuura, C. Y. Feng e K. C. Khulbe

Property Description
ISBN: 9783540739944
Publisher: Springer Berlin Heidelberg
Release Date: December of 2007
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Springer Laboratory
Categories: eBooks in English > Social Sciences and Humanities > History and Scientific Methodology
EAN: 9783540739944

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