Capa do artigo Reliability Wearout Mechanisms In Advanced Cmos Technologies
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Reliability Wearout Mechanisms In Advanced Cmos Technologies eBook

by Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Iii Stewart E. Rauch, Giuseppe La Rosa, Timothy D. Sullivan e Jordi Sune
language: english
Publisher: WILEY, October of 2009 ‧
217,23€
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Ebook for ADE
This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

Reliability Wearout Mechanisms In Advanced Cmos Technologies

by Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Iii Stewart E. Rauch, Giuseppe La Rosa, Timothy D. Sullivan e Jordi Sune

Property Description
ISBN: 9780470455258
Publisher: WILEY
Release Date: October of 2009
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Ieee Press Series On Microelectronic Systems
Categories: eBooks in English > Engineering > Electricity and Energy
EAN: 9780470455258

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