Capa do artigo Nanometer Variation-Tolerant Sram
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Nanometer Variation-Tolerant Sram eBook

Circuits And Statistical Design For Yield

by Mohamed Abu Rahma e Mohab Anis
language: english
Publisher: SPRINGER NEW YORK, September of 2012 ‧
118,59€
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Ebook for ADE
This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.

Nanometer Variation-Tolerant Sram

Circuits And Statistical Design For Yield

by Mohamed Abu Rahma e Mohab Anis

Property Description
ISBN: 9781461417491
Publisher: SPRINGER NEW YORK
Release Date: September of 2012
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Engineering
Categories: eBooks in English > Engineering > Electricity and Energy
eBooks in English > Computing > CAD
EAN: 9781461417491

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