Capa do artigo Measurement Technology For Micro-Nanometer Devices
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Measurement Technology For Micro-Nanometer Devices eBook

by Jingdong Chen, Zongmin Ma, Wendong Zhang, Xiujian Chou, Chenyang Xue, Haifei Bao, Liguo Chen, Dachao Li e Tielin Shi
language: english
Publisher: WILEY, October of 2016 ‧
162,91€
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A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale Highlights the advanced research work from industry and academia in micro-nano devices test technology Written at both introductory and advanced levels, provides the fundamentals and theories Focuses on the measurement techniques for characterizing MEMS/NEMS devices

Measurement Technology For Micro-Nanometer Devices

by Jingdong Chen, Zongmin Ma, Wendong Zhang, Xiujian Chou, Chenyang Xue, Haifei Bao, Liguo Chen, Dachao Li e Tielin Shi

Property Description
ISBN: 9781118717981
Publisher: WILEY
Release Date: October of 2016
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Categories: eBooks in English > Engineering > General Engineering
EAN: 9781118717981

JINGDONG CHEN

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ZONGMIN MA

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CHENYANG XUE

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