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Introduction To Advanced System-On-Chip Test Design And Optimization eBook
language: english
Publisher:
SPRINGER US, March of 2006 ‧
see product details
171,59€
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Ebook for ADE
SYNOPSIS
Testing of Integrated Circuits is important to ensure the production of fault-free chips. This book deals with SOC test design and its optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780387256245 |
| Publisher: | SPRINGER US |
| Release Date: | March of 2006 |
| Language: | English |
| Format: | eBook |
| File Format and Compatibility: | PDF para ADE |
| Collection: | Frontiers In Electronic Testing |
| Categories: |
eBooks in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9780387256245 |
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