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Interfacial Compatibility In Microelectronics eBook

Moving Away From The Trial And Error Approach

by Tomi Laurila, Vesa Vuorinen, Toni T. Mattila, Markus Turunen, Jorma Kivilahti e Mervi Paulasto-Krockel
language: english
Publisher: SPRINGER LONDON, January of 2012 ‧
171,59€
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Ebook for ADE
This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.

Interfacial Compatibility In Microelectronics

Moving Away From The Trial And Error Approach

by Tomi Laurila, Vesa Vuorinen, Toni T. Mattila, Markus Turunen, Jorma Kivilahti e Mervi Paulasto-Krockel

Property Description
ISBN: 9781447124702
Publisher: SPRINGER LONDON
Release Date: January of 2012
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Microsystems
Categories: eBooks in English > Engineering > General Engineering
EAN: 9781447124702