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Integrated Circuit Defect-Sensitivity: Theory And Computational Models eBook

by Jose Pineda De Gyvez
language: english
Publisher: SPRINGER US, November of 2013 ‧
118,59€
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Ebook for ADE
Reviews the importance of a defect-sensitivity analysis in contemporary VLSI design processes. The modelling of defects in microelectronics technologies is revised, introducing the reader to critical area analysis through the construction of formal mathematical models.

Integrated Circuit Defect-Sensitivity: Theory And Computational Models

by Jose Pineda De Gyvez

Property Description
ISBN: 9781461531586
Publisher: SPRINGER US
Release Date: November of 2013
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Categories: eBooks in English > Engineering > Electricity and Energy
EAN: 9781461531586