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High Quality Test Pattern Generation And Boolean Satisfiability eBook

by Stephan Eggersglu e Rolf Drechsler
language: english
Publisher: SPRINGER NEW YORK, February of 2012 ‧
118,59€
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Ebook for ADE
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.

High Quality Test Pattern Generation And Boolean Satisfiability

by Stephan Eggersglu e Rolf Drechsler

Property Description
ISBN: 9781441999764
Publisher: SPRINGER NEW YORK
Release Date: February of 2012
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Engineering
Categories: eBooks in English > Engineering > Electricity and Energy
EAN: 9781441999764