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High Performance Memory Testing eBook
Design Principles, Fault Modeling And Self-Test
language: english
Publisher:
SPRINGER US, December of 2005 ‧
see product details
171,59€
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IMMEDIATE AVAILABILITY
Ebook for ADE
SYNOPSIS
Memory applications and the number of designs and the sheer number of bits on each design are critical. Based on the author's experience in memory design, memory reliability development and memory self test, this book is written for professionals and researchers, helping them understand the memories that are tested.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780306479724 |
| Publisher: | SPRINGER US |
| Release Date: | December of 2005 |
| Language: | English |
| Format: | eBook |
| File Format and Compatibility: | PDF para ADE |
| Collection: | Frontiers In Electronic Testing |
| Categories: |
eBooks in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9780306479724 |
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