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High-Level Estimation And Exploration Of Reliability For Multi-Processor System-On-Chip eBook
language: english
Publisher:
Springer Nature Singapore, June of 2017 ‧
see product details
118,59€
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IMMEDIATE AVAILABILITY
Ebook for ADE
SYNOPSIS
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9789811010736 |
| Publisher: | Springer Nature Singapore |
| Release Date: | June of 2017 |
| Language: | English |
| Format: | eBook |
| File Format and Compatibility: | PDF para ADE |
| Collection: | Computer Architecture And Design Methodologies |
| Categories: |
eBooks in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9789811010736 |
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