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Fundamentals Of Nanoscale Film Analysis eBook

by James W. Mayer, L.C. Feldman e Terry L. Alford
language: english
Publisher: SPRINGER US, April of 2007 ‧
86,11€
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Modern science and technology, from materials science to integrated circuit development, is directed toward the nanoscale. This work concentrates on analysis of the structure and composition of the surface and the outer few tens to hundred nanometers in depth. It also presents a variety of analytical and scanning probe microscopy techniques.

Fundamentals Of Nanoscale Film Analysis

by James W. Mayer, L.C. Feldman e Terry L. Alford

Property Description
ISBN: 9780387292618
Publisher: SPRINGER US
Release Date: April of 2007
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Categories: eBooks in English > Science > Chemical
EAN: 9780387292618