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Fundamentals Of Atomic Force Microscopy - Part I: Foundations eBook

Part I: Foundations

by Reifenberger Ronald G Reifenberger
language: english
Publisher: WORLD SCIENTIFIC PUBLISHING COMPANY, September of 2015 ‧
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The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution.

Fundamentals Of Atomic Force Microscopy - Part I: Foundations

Part I: Foundations

by Reifenberger Ronald G Reifenberger

Property Description
ISBN: 9789814630375
Publisher: WORLD SCIENTIFIC PUBLISHING COMPANY
Release Date: September of 2015
Language: English
Pages: 340
Format: eBook
File Format and Compatibility:
Collection: Lessons From Nanoscience: A Lecture Notes Series
Categories: eBooks in English > Science > Physical
eBooks in English > Engineering > General Engineering
EAN: 9789814630375
Acessibilidade: Ver características de acessibilidade indicadas pelo editor