Capa do artigo From Contamination To Defects, Faults And Yield Loss

10% OFF

From Contamination To Defects, Faults And Yield Loss eBook

Name: From Contamination To Defects, Faults And Yield Loss
Price: 118.59 EUR
Author: Jitendra B. Khare e Wojciech Maly
ISBN: 9781461313779

Simulation And Applications

by Jitendra B. Khare e Wojciech Maly

language: english

Publisher: SPRINGER US, December of 2012 ‧ see product details

(0)

be the first to comment

118,59€

10% OFF CARD

IMMEDIATE AVAILABILITY

Ebook for ADE

SYNOPSIS

Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

DETAILS

From Contamination To Defects, Faults And Yield Loss

Simulation And Applications

by Jitendra B. Khare e Wojciech Maly
Property	Description
ISBN:	9781461313779
Publisher:	SPRINGER US
Release Date:	December of 2012
Language:	English
Format:	eBook
File Format and Compatibility:	PDF para ADE
Collection:	Frontiers In Electronic Testing
Categories:	eBooks in English > Engineering > Electricity and Energy
EAN:	9781461313779

BOOKS FROM THE SAME COLLECTION

10%

Timing Performance Of Nanometer Digital Circuits Under Process Variations

Jose Garcia GervacioandVictor Champac

Springer Nature Switzerland AG

148,70€ 10% CARD

free shipping
eBook

10%

Timing Performance Of Nanometer Digital Circuits Under Process Variations

Jose Garcia GervacioandVictor Champac

Springer International Publishing

145,09€ 10% CARD
10%

The Blackout In Britain And Germany, 1939â€“1945

Marc Wiggam

Springer International Publishing AG

67,58€ 10% CARD

free shipping
eBook

10%

Models In Hardware Testing

SPRINGER NETHERLANDS

118,59€ 10% CARD

SEE MORE TITLES FROM THIS COLLECTION

FROM THE SAME AUTHORS