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Design-For-Test And Test Optimization Techniques For Tsv-Based 3d Stacked Ics eBook

by Brandon Noia e Krishnendu Chakrabarty
language: english
Publisher: Springer International Publishing, November of 2013 ‧
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Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

Design-For-Test And Test Optimization Techniques For Tsv-Based 3d Stacked Ics

by Brandon Noia e Krishnendu Chakrabarty

Property Description
ISBN: 9783319023786
Publisher: Springer International Publishing
Release Date: November of 2013
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Engineering
Categories: eBooks in English > Science > Physical
eBooks in English > Engineering > Electricity and Energy
EAN: 9783319023786

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