adicionar à lista de desejos
Design For At-Speed Test, Diagnosis And Measurement eBook
language: english
Publisher:
SPRINGER US, April of 2006 ‧
see product details
171,59€
10% OFF
CARD
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
IMMEDIATE AVAILABILITY
Ebook for ADE
SYNOPSIS
Offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. This book contains a complete design flow and analysis of the impact of embedded test on a design.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780306475443 |
| Publisher: | SPRINGER US |
| Release Date: | April of 2006 |
| Language: | English |
| Format: | eBook |
| File Format and Compatibility: | PDF para ADE |
| Collection: | Frontiers In Electronic Testing |
| Categories: |
eBooks in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9780306475443 |
BOOKS FROM THE SAME COLLECTION
-
10%Timing Performance Of Nanometer Digital Circuits Under Process VariationsSpringer Nature Switzerland AG148,70€ 10% CARDfree shipping
-
eBook10%Timing Performance Of Nanometer Digital Circuits Under Process VariationsSpringer International Publishing145,09€ 10% CARD