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Delay Fault Testing For Vlsi Circuits eBook
language: english
Publisher:
SPRINGER US, December of 2012 ‧
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171,59€
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Ebook for ADE
SYNOPSIS
In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech- niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9781461555971 |
| Publisher: | SPRINGER US |
| Release Date: | December of 2012 |
| Language: | English |
| Format: | eBook |
| File Format and Compatibility: | PDF para ADE |
| Collection: | Frontiers In Electronic Testing |
| Categories: |
eBooks in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9781461555971 |
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