Capa do artigo Defect-Oriented Testing For Nano-Metric Cmos Vlsi Circuits

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Defect-Oriented Testing For Nano-Metric Cmos Vlsi Circuits eBook

Name: Defect-Oriented Testing For Nano-Metric Cmos Vlsi Circuits
Price: 237.84 EUR
Author: Jose Pineda De Gyvez e Manoj Sachdev
ISBN: 9780387465470

by Jose Pineda De Gyvez e Manoj Sachdev

language: english

Publisher: SPRINGER US, June of 2007 ‧ see product details

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SYNOPSIS

Presents the work on defect-oriented testing. This book is useful for test and design practitioners from academia and industry.

DETAILS

Defect-Oriented Testing For Nano-Metric Cmos Vlsi Circuits

by Jose Pineda De Gyvez e Manoj Sachdev
Property	Description
ISBN:	9780387465470
Publisher:	SPRINGER US
Release Date:	June of 2007
Language:	English
Format:	eBook
File Format and Compatibility:	PDF para ADE
Collection:	Frontiers In Electronic Testing
Categories:	eBooks in English > Engineering > Electricity and Energy
EAN:	9780387465470

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