Capa do artigo Cmos Sram Circuit Design And Parametric Test In Nano-Scaled Technologies
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Cmos Sram Circuit Design And Parametric Test In Nano-Scaled Technologies eBook

Process-Aware Sram Design And Test

by Manoj Sachdev e Andrei Pavlov
language: english
Publisher: SPRINGER NETHERLANDS, June of 2008 ‧
184,84€
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Covers a broad range of topics related to SRAM design and test. This book places emphasis on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Cmos Sram Circuit Design And Parametric Test In Nano-Scaled Technologies

Process-Aware Sram Design And Test

by Manoj Sachdev e Andrei Pavlov

Property Description
ISBN: 9781402083631
Publisher: SPRINGER NETHERLANDS
Release Date: June of 2008
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Frontiers In Electronic Testing
Categories: eBooks in English > Engineering > Electricity and Energy
EAN: 9781402083631

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