Built-In-Self-Test And Digital Self-Calibration For Rf Socs eBook
language: english
Publisher:
SPRINGER NEW YORK, September of 2011 ‧
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Ebook for ADE
SYNOPSIS
This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9781441995483 |
| Publisher: | SPRINGER NEW YORK |
| Release Date: | September of 2011 |
| Language: | English |
| Format: | eBook |
| File Format and Compatibility: | PDF para ADE |
| Collection: | Springerbriefs In Electrical And Computer Engineering |
| Categories: |
eBooks in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9781441995483 |
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