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Analog Layout Generation For Performance And Manufacturability eBook

by Willy M.C. Sansen, Georges Gielen e Koen Lampaert
language: english
Publisher: SPRINGER US, April of 2013 ‧
118,59€
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Ebook for ADE
Outlines a criterion to quantify the detectability of a fault and combines this with a yield model to evaluate the testability of an integrated circuit layout. This book is intended for analog engineers, researchers and students.

Analog Layout Generation For Performance And Manufacturability

by Willy M.C. Sansen, Georges Gielen e Koen Lampaert

Property Description
ISBN: 9781475745016
Publisher: SPRINGER US
Release Date: April of 2013
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Categories: eBooks in English > Engineering > Electricity and Energy
EAN: 9781475745016