Capa do artigo Analog Ic Reliability In Nanometer Cmos
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Analog Ic Reliability In Nanometer Cmos eBook

by Elie Maricau e Georges Gielen
language: english
Publisher: SPRINGER NEW YORK, January of 2013 ‧
118,59€
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Ebook for ADE
This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more.

Analog Ic Reliability In Nanometer Cmos

by Elie Maricau e Georges Gielen

Property Description
ISBN: 9781461461630
Publisher: SPRINGER NEW YORK
Release Date: January of 2013
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Analog Circuits And Signal Processing
Categories: eBooks in English > Engineering > Electricity and Energy
EAN: 9781461461630

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