Capa do artigo Advanced Test Methods For Srams
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Advanced Test Methods For Srams eBook

Effective Solutions For Dynamic Fault Detection In Nanoscaled Technologies

by Patrick Girard, Alberto Bosio, Arnaud Virazel, Serge Pravossoudovitch e Luigi Dilillo
language: english
Publisher: SPRINGER US, October of 2009 ‧
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Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here.

Advanced Test Methods For Srams

Effective Solutions For Dynamic Fault Detection In Nanoscaled Technologies

by Patrick Girard, Alberto Bosio, Arnaud Virazel, Serge Pravossoudovitch e Luigi Dilillo

Property Description
ISBN: 9781441909381
Publisher: SPRINGER US
Release Date: October of 2009
Language: English
Pages: 171
Format: eBook
File Format and Compatibility:
Collection: Engineering
Categories: eBooks in English > Engineering > Electricity and Energy
eBooks in English > Computing > CAD
EAN: 9781441909381
Acessibilidade: Ver características de acessibilidade indicadas pelo editor

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