Cher Ming Tan
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Reliability And Failure Analysis Of High-Power Led PackagingeBookELSEVIER SCIENCE09-20220,00€
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Electromigration Modeling At Circuit Layout LeveleBookSpringer Nature Singapore03-20130,00€
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Applications Of Finite Element Methods For Reliability Studies On Ulsi InterconnectionseBookSPRINGER LONDON03-20110,00€