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Scanning Probe Microscopy eBook
Atomic Force Microscopy And Scanning Tunneling Microscopy
idioma: inglês
Editor:
Springer Berlin Heidelberg, fevereiro de 2015 ‧
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237,84€
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DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Scanning Probe Microscopy
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9783662452400 |
| Editor: | Springer Berlin Heidelberg |
| Data de Lançamento: | fevereiro de 2015 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Coleção: | Nanoscience And Technology |
| Classificação Temática: |
eBooks em Inglês
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Ciências Exatas e Naturais
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Física
|
| EAN: | 9783662452400 |
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