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Design-For-Test And Test Optimization Techniques For Tsv-Based 3d Stacked Ics eBook

Name: Design-For-Test And Test Optimization Techniques For Tsv-Based 3d Stacked Ics
Price: 118.59 EUR
Author: Brandon Noia e Krishnendu Chakrabarty
ISBN: 9783319023786

de Brandon Noia e Krishnendu Chakrabarty

idioma: inglês

Editor: Springer International Publishing, novembro de 2013 ‧ ver detalhes do produto

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Ebook para ADE

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Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

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Design-For-Test And Test Optimization Techniques For Tsv-Based 3d Stacked Ics

de Brandon Noia e Krishnendu Chakrabarty
Propriedade	Descrição
ISBN:	9783319023786
Editor:	Springer International Publishing
Data de Lançamento:	novembro de 2013
Idioma:	Inglês
Tipo de produto:	eBook
Formato e Compatibilidade:	PDF para ADE
Coleção:	Engineering
Classificação Temática:	eBooks em Inglês > Ciências Exatas e Naturais > Física eBooks em Inglês > Engenharia > Eletricidade e Energia
EAN:	9783319023786

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