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Analog Layout Generation For Performance And Manufacturability eBook
idioma: inglês
Editor:
SPRINGER US, abril de 2013 ‧
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118,59€
10% DESCONTO
CARTÃO
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DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Outlines a criterion to quantify the detectability of a fault and combines this with a yield model to evaluate the testability of an integrated circuit layout. This book is intended for analog engineers, researchers and students.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781475745016 |
| Editor: | SPRINGER US |
| Data de Lançamento: | abril de 2013 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Classificação Temática: |
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| EAN: | 9781475745016 |