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Analog Ic Reliability In Nanometer Cmos eBook
idioma: inglês
Editor:
SPRINGER NEW YORK, Janeiro de 2013 ‧
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118,59€
10% DESCONTO
CARTÃO
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DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781461461630 |
| Editor: | SPRINGER NEW YORK |
| Data de Lançamento: | Janeiro de 2013 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Coleção: | Analog Circuits And Signal Processing |
| Classificação Temática: |
eBooks em Inglês
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Eletricidade e Energia
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| EAN: | 9781461461630 |
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