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Thermally Activated Mechanisms In Crystal Plasticity
language: english
Publisher:
ELSEVIER SCIENCE & TECHNOLOGY, September of 2003 ‧
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SYNOPSIS
Contains data from a range of techniques, including synchrotron radiation X-ray topography that provide safer and surer methods of identifying deformation mechanisms. This book also informs the direction of research in intermediate and high temperature processes by providing original treatment of dislocation climb.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780080427034 |
| Publisher: | ELSEVIER SCIENCE & TECHNOLOGY |
| Release Date: | September of 2003 |
| Language: | English |
| Cover: | Hardcover |
| Pages: | 452 |
| Format: | Book |
| Collection: | Pergamon Materials Series |
| Categories: |
Books in English
>
Engineering
>
Mechanical Engineering
|
| EAN: | 9780080427034 |
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