Star Trek: Discovery - Aftermath

by Kirsten Beyer
language: english
Publisher: IDEA & DESIGN WORKS, April of 2020 ‧
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Star Trek: Discovery - Aftermath

by Kirsten Beyer

Property Description
ISBN: 9781684056507
Publisher: IDEA & DESIGN WORKS
Release Date: April of 2020
Language: English
Dimensions: 259 x 168 x 9 mm
Cover: Softcover
Pages: 96
Format: Book
Collection: Artisan Edition
Categories: Books in English > Fiction > Science fiction
Books in English > Others
EAN: 9781684056507