Capa do artigo Single Electron Spin Measurements In Submicron Si Mos-Fets Random Telegraph Signal, Single Electron Spin Resonance

Single Electron Spin Measurements In Submicron Si Mos-Fets Random Telegraph Signal, Single Electron Spin Resonance

by Ming Xiao
language: english
Publisher: VDM Verlag, December of 2008 ‧
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Single Electron Spin Measurements In Submicron Si Mos-Fets Random Telegraph Signal, Single Electron Spin Resonance

by Ming Xiao

Property Description
ISBN: 9783836493758
Publisher: VDM Verlag
Release Date: December of 2008
Language: English
Cover: Softcover
Pages: 124
Format: Book
Categories: Books in English > Science > Physical
EAN: 9783836493758

MING XIAO

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