Next Generation Halt And Hass

Robust Design Of Electronics And Systems

by John J. Paschkewitz e Kirk A. Gray
language: english
Publisher: JOHN WILEY & SONS INC, May of 2016 ‧
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Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks.

Next Generation Halt And Hass

Robust Design Of Electronics And Systems

by John J. Paschkewitz e Kirk A. Gray

Property Description
ISBN: 9781118700235
Publisher: JOHN WILEY & SONS INC
Release Date: May of 2016
Language: English
Dimensions: 170 x 244 x 20 mm
Cover: Hardcover
Pages: 296
Format: Book
Collection: Wiley Software Patterns Series
Categories: Books in English > Engineering > Electricity and Energy
Books in English > Others
EAN: 9781118700235