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Materials Science In Microelectronics Ii
The Effects Of Structure On Properties In Thin Films
language: english
Publisher:
ELSEVIER SCIENCE & TECHNOLOGY, November of 2005 ‧
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SYNOPSIS
Looks at the importance of thin films to microelectronic development. This title examines the effect of structure on: electrical properties; magnetic properties; optical properties; mechanical properties; mass transport properties; interface and junction properties; defects and properties.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780080446394 |
| Publisher: | ELSEVIER SCIENCE & TECHNOLOGY |
| Release Date: | November of 2005 |
| Language: | English |
| Cover: | Hardcover |
| Pages: | 228 |
| Format: | Book |
| Collection: | Ipv-Ifac Proceedings Volume |
| Categories: |
Books in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9780080446394 |
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