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Istfa 2017 Proceedings From The 43rd International Symposium For Testing And Failure Analysis

Istfa 2017 Proceedings From The 43rd International Symposium For Testing And Failure Analysis

by Asm International
language: english
Publisher: A S M International, January of 2018 ‧
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The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

Istfa 2017 Proceedings From The 43rd International Symposium For Testing And Failure Analysis

by Asm International

Property Description
ISBN: 9781627081504
Publisher: A S M International
Release Date: January of 2018
Language: English
Dimensions: 152 x 229 x 20 mm
Cover: Softcover
Pages: 660
Format: Book
Collection: Asm Handbook
Categories: Books in English > Engineering > Electricity and Energy
Books in English > Others
EAN: 9781627081504

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