Istfa 2015 Proceedings From The 41st International Symposium For Testing And Failure Analysis

by Asm International
language: english
Publisher: A S M International, January of 2016 ‧
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Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!

Istfa 2015 Proceedings From The 41st International Symposium For Testing And Failure Analysis

by Asm International

Property Description
ISBN: 9781627081023
Publisher: A S M International
Release Date: January of 2016
Language: English
Dimensions: 152 x 229 x 20 mm
Cover: Softcover
Pages: 500
Format: Book
Collection: Studies In Print Culture And History Of The Book
Categories: Books in English > Engineering > General Engineering
EAN: 9781627081023

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