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Istfa 2015 Proceedings From The 41st International Symposium For Testing And Failure Analysis
language: english
Publisher:
A S M International, January of 2016 ‧
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SYNOPSIS
Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9781627081023 |
| Publisher: | A S M International |
| Release Date: | January of 2016 |
| Language: | English |
| Dimensions: | 152 x 229 x 20 mm |
| Cover: | Softcover |
| Pages: | 500 |
| Format: | Book |
| Collection: | Studies In Print Culture And History Of The Book |
| Categories: |
Books in English
>
Engineering
>
General Engineering
|
| EAN: | 9781627081023 |
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