Characterization In Compound Semiconductor Processing

by Yale E. Strausser e Gary E. Mcguire
language: english
Publisher: Momentum Press, February of 2010 ‧
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Reviews the common classes of compound semiconductors, their physical, optical and electrical properties and the various types of methods used for characterizing them when analyzing for defects and application problems. This book features: characterization of III-V Thin Films for Electronic and Optical applications.

Characterization In Compound Semiconductor Processing

by Yale E. Strausser e Gary E. Mcguire

Property Description
ISBN: 9781606500415
Publisher: Momentum Press
Release Date: February of 2010
Language: English
Dimensions: 155 x 236 x 15 mm
Cover: Hardcover
Pages: 212
Format: Book
Collection: Materials Characterization Series
Categories: Books in English > Engineering > Mechanical Engineering
Books in English > Others
EAN: 9781606500415