Atomic Force Microscopy In Process Engineering

An Introduction To Afm For Improved Processes And Products

by Richard Bowen, W. Richard Bowen e Nidal Hilal
language: english
Publisher: ELSEVIER SCIENCE & TECHNOLOGY, July of 2009 ‧
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Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. This book aims to bring together both the basic theory and proven process engineering practice of AFM. It offers an approach to ensure that it is also directly applicable to practical process engineering problems.

Atomic Force Microscopy In Process Engineering

An Introduction To Afm For Improved Processes And Products

by Richard Bowen, W. Richard Bowen e Nidal Hilal

Property Description
ISBN: 9781856175173
Publisher: ELSEVIER SCIENCE & TECHNOLOGY
Release Date: July of 2009
Language: English
Cover: Hardcover
Pages: 304
Format: Book
Categories: Books in English > Engineering > General Engineering
EAN: 9781856175173