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Atomic Force Microscopy In Process Engineering
An Introduction To Afm For Improved Processes And Products
language: english
Publisher:
ELSEVIER SCIENCE & TECHNOLOGY, July of 2009 ‧
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SYNOPSIS
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. This book aims to bring together both the basic theory and proven process engineering practice of AFM. It offers an approach to ensure that it is also directly applicable to practical process engineering problems.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9781856175173 |
| Publisher: | ELSEVIER SCIENCE & TECHNOLOGY |
| Release Date: | July of 2009 |
| Language: | English |
| Cover: | Hardcover |
| Pages: | 304 |
| Format: | Book |
| Categories: |
Books in English
>
Engineering
>
General Engineering
|
| EAN: | 9781856175173 |