Capa do artigo Atom Probe Field Ion Microscopy

Atom Probe Field Ion Microscopy

by M. G. Hetherington e A. (Department Of Materials, Department Of Materials, University Of Oxford) Cerezo
language: english
Publisher: Oxford University Press, September of 1996 ‧
OUT OF STOCK OR NOT AVAILABLE
Sell ​​your book
A definitive account of the theory, practice, and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. New applications for this technique are rapidly emerging and graduate level material and surface scientists will enjoy this account of the state-of-the-art.

Atom Probe Field Ion Microscopy

by M. G. Hetherington e A. (Department Of Materials, Department Of Materials, University Of Oxford) Cerezo

Property Description
ISBN: 9780198513872
Publisher: Oxford University Press
Release Date: September of 1996
Language: English
Cover: Hardcover
Pages: 520
Format: Book
Collection: Monographs On The Physics And Chemistry Of Materials
Categories: Books in English > Social Sciences and Humanities > History and Scientific Methodology
EAN: 9780198513872

BOOKS FROM THE SAME COLLECTION

SEE MORE TITLES FROM THIS COLLECTION