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Nanometer Variation-Tolerant Sram eBook
Circuits And Statistical Design For Yield
idioma: inglês
Editor:
SPRINGER NEW YORK, setembro de 2012 ‧
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118,59€
10% DESCONTO
CARTÃO
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DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781461417491 |
| Editor: | SPRINGER NEW YORK |
| Data de Lançamento: | setembro de 2012 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Coleção: | Engineering |
| Classificação Temática: |
eBooks em Inglês
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Engenharia
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Eletricidade e Energia
eBooks em Inglês > Informática > CAD |
| EAN: | 9781461417491 |
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